C. Ju and T. K. Trinh, “A Machine Learning Approach to Supply Chain Vulnerability Early Warning System: Evidence from U.S. Semiconductor Industry”, JACS, vol. 3, no. 11, pp. 21–35, Nov. 2023, Accessed: Sep. 05, 2026. [Online]. Available: https://ciajournal.com/index.php/JACS/article/view/77